Optical frequency analyzer using a local oscillator heterodyne detection of incident light
AssigneeYokogawa Electric Corporation
InventorsHideto Iwaoka, Akira Ohte, Koji Akiyama
Life of this patent
Estimating the term…
Abstract
An optical frequency analyzer for measuring an optical frequency spectrum with high accuracy, high resolving power and high stability by heterodyne detecting the incident light with the aid of a local oscillator, wherein the local oscillator comprises an optical frequency synthesizer/sweeper or a marker signal attached tunable laser. The optical frequency analyzer can be modified to measure the incident light itself as the object of measurement or light emerging from the object of measurement can be the incident light.
Claims34
An optical frequency analyzer for measuring frequency characteristics of an object on the basis of incident light, said optical frequency analyzer comprising
- means for applying incident light to an object;
- an optical frequency sweeping means for frequency sweeping light and for outputting frequency swept light of a first frequency;
- an optical heterodyne detector means for heterodyning said frequency swept light of said first frequency from said optical frequency sweeping means and light of a second frequency indicative of said incident light, and for outputting an electrical signal having a frequency corresponding to the difference between said first and second frequencies;
- first filter means for filtering said electrical signal from said optical heterodyne detector means and for producing an electrical output indicative of the filtered results;
- and
- a signal processing/displaying means for processing and displaying said electrical signal from said first filter means.
Dependencies are inferred from the claim text.