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US 4,838,695 AGranted
Apparatus for measuring reflectivity
AssigneeBoston University
InventorsMasud Mansuripur, Michael Ruane, Robert Rosenvold
Life of this patent
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Abstract
An apparatus for measuring the reflectivity of magnetooptic materials where the complex reflection coefficients of absorbing anisotropic media are determined. Amorphous rare-earth transition metal alloys exhibiting polar Kerr effect are analyzed for use as storage media in erasable optical storage systems.
Claims16
Apparatus for measuring reflectivity comprising:
- a polarized light source;
- a first rotatable device to rotate a direction of polarization of polarized light from the source to any of a plurality of selectable angles;
- a magnettooptic material illuminated by and reflecting light from the source;
- a second device positionable in any of a plurality of selectable positions to alter the phase of the light reflected by the material;
- a third device for rotating the direction of polarization of the reflected light;
- first and second detectors to simultaneously measure the intensity of the electric field of light reflected by said material in two orthogonal planes;
- and
- determining means for determining reflection coefficients of the magnetooptic material with the measured intensities.
5 more elements
Dependencies are inferred from the claim text.