Device for the EMI testing of electronic systems
AssigneeBBC Brown, Boveri & Company, Limited
InventorsDiethard Hansen, Dietrich Konigstein
Life of this patent
Estimating the term…
Abstract
The device according to the invention exhibits a TEM waveguide (1), which opens out in a pyramid shape and which is closed by a wall (7) of high-frequency peak absorbers (7.1) and which exhibits an asymmetrically disposed, plate-shaped inner line (6), which is connected to a plurality of terminal resistors (8.1, 8.2, 8.3) through the absorber wall (7). The TEM waveguide (1) further exhibits a closed outer line (5). The absorber wall (7) is curved in the manner of a spherical segment, the center of curvature being situated in the region of the tip (2) of the pyramid-shaped TEM waveguide (1).
Claims9
A device for the EMI testing of electronic systems having a TEM waveguide (1), which opens out in a pyramid shape and which is terminated by a wall (7) of high-frequency peak absorbers (7.1) and which exhibits an asymmetrically disposed, plate-shaped inner line (6), which is connected to a number of terminal resistors (8.1, 8.2, 8.3) through the absorber wall (7), wherein the TEM waveguide (1) exhibits a closed outer line (5), wherein the absorber wall (7) is curved in the manner of a spherical segment, and wherein the center of curvature is situated in the region of the tip (2) of the pyramid-shaped TEM waveguide (1).
Dependencies are inferred from the claim text.