Method for growing single crystal thin films of element semiconductor
AssigneesResearch Development Corporation of Japan, Junichi Nishizawa, Seiko Instruments Inc.
InventorsJunichi Nishizawa, Kenji Aoki
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AssigneesResearch Development Corporation of Japan, Junichi Nishizawa, Seiko Instruments Inc.
InventorsJunichi Nishizawa, Kenji Aoki
Estimating the term…
A method for growing a single crystal thin film of an element semiconductor which comprises repeating the successive operations of feeding a single kind of gas containing the element semiconductor as a component element onto a substrate heated in a growth chamber and then exhausting the gas in the growth chamber under controlled conditions and thereby growing the single crystal thin film of said element semiconductor in a desired thickness with a precision of monomolecular layer. In an alternate method for growing a single crystal thin film of an element semiconductor, the sole gas containing the element semiconductor is continuously fed onto the substrate for a given period of time, thereby forming a single crystal thin film of element semiconductor having a desired thickness. According to the present invention, there can be obtained single crystal thin films with high quality in a high reproducibility, by simplified operating parameters and growing apparatus.
A method for growing a single crystal thin film of silicon, said method comprising:
A method for growing a single crystal thin film of silicon by the molecular layer epitaxy crystal-growth method, which consists essentially of:
Dependencies are inferred from the claim text.