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US 4,831,845 AGranted
Temperature testing device provided with sample-receiving chamber from which a specimen is easily detachable and in which temperature is controllable
AssigneesYasukage Oda, Sumitomo Heavy Industries, Ltd.
InventorsYasukage Oda, Hiroshi Asami
Life of this patent
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Abstract
A temperature testing device in which a sample-receiving sealable chamber from which a specimen can be easily detached and a cooling portion of a refrigeration unit are inserted into a single vacuum vessel, and in which a gaseous refrigerant is circulated between the cooling portion of the refrigeration unit and the sample-receiving chamber so that the sample-receiving chamber can be cooled.
Claims4
A temperature testing device comprising:
- (a) a vacuum vessel;
- (b) an elongated vertical chamber adapted to receive a sample, substantially most part of which is inserted into said vacuum vessel and having an opening with a cap exposed outside said vacuum vessel;
- (c) a refrigeration unit with a cooling portion which is provided in said vacuum vessel;
- (d) a pump which is provided outside said vacuum vessel and is used for circulating a gaseous refrigerant;
- (e) a first pipe which connects the outlet side of said pump to a gas inlet provided in the vicinity of the bottom of said sample-receiving chamber while passing through a heat exchanger provided on said cooling portion of said refrigeration unit and passing through a temperature control means so that said gaseous refrigerant expelled from said pump is supplied to said sample-receiving chamber;
- and
- (f) a second pipe which connects a gas outlet provided substantially in an intermediate portion of said sample-receiving chamber in the lengthwise direction thereof to a inlet side of said pump so that said gaseous refrigerant in said sample-receiving chamber is returned to said pump.
4 more elements
Dependencies are inferred from the claim text.