Method of aligning a linear array X-ray detector
AssigneeGeneral Electric Company
InventorsDouglas S. Steele, John P. Keaveney, David W. Oliver
Life of this patent
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AssigneeGeneral Electric Company
InventorsDouglas S. Steele, John P. Keaveney, David W. Oliver
Estimating the term…
An X-ray inspection system includes an X-ray source for generating a directed X-ray beam and a linear array detector for measuring the intensity of the received radiation and generating electrical signals representative thereof. A method for aligning the detector with the directed X-ray beam includes removing any part between the X-ray source and the detector, opening an X-ray beam limiter, positioning the linear array detector for maximum signal from each detector element, reducing the X-ray beam limiter opening, detecting whether any signal from a detector element is reduced, moving the limiter for producing a maximum signal on each signal, securing the X-ray beam limiter, and positioning the detector array for maximum signal.
In a computer based system for non-destructive measuring and testing of manufactured parts, the system including an X-ray source for providing a beam of X-ray radiation, a beam limiter positioned in the beam of radiation and having an adjustable gap in at least one plane and being positionable in the at least one plane for establishing a directed beam of radiation, a linear array X-ray detector having a plurality of radiation detecting elements for converting detected radiation into electrical signals, the detector being generally oriented in the directed beam of radiation, and a collimator coupled to the detector for restricting radiation received by the detector to a predetermined range of approach angles, a method for aligning the detector to the directed beam of X-ray radiation comprising the steps of:
Dependencies are inferred from the claim text.