Transfer circuit for operation test of LSI systems
AssigneeKabushiki Kaisha Toshiba
InventorShojiro Mori
Life of this patent
Estimating the term…
Abstract
A transfer circuit for the operation test of an LSI system inlcudes a mode setting section for selectively setting a first or second operation mode, a plurality of first shift register circuits connected to the input terminals of function blocks of the LSI system to respectively latch input data to the function blocks in a parallel fashion in the first operation mode and shift the input data in the second operation mode, a plurality of second shift register circuits connected to the output terminals of the function blocks of the LSI system to respectively latch output data of the function blocks in a parallel fashion in the first operation mode and shift the output data in the second operation mode, and a serial transfer line for serially connecting the first and second shift register circuits.
Claims9
A transfer circuit for the operation test of an LSI system comprising:
- mode setting means for selectively setting a first or second operation mode;
- a plurality of first shift register means connected to function blocks of said LSI system and each including a plurality of scan registers which are connected to input terminals of a corresponding one of the function blocks to respectively latch input data of the corresponding function block in the first operation mode and which are serially connected to shift the contents in the second operation mode;
- a plurality of second shift register means connected to the function blocks of said LSI system and each including a plurality of scan registers which are connected to output terminals of a corresponding one of the function blocks to respectively latch output data of the corresponding function block in the first operation mode and which are serially connected to shift the contents in the second operation mode;
- and
- serial transfer means for serially connecting said first and second shift register means to constitute a shift register circuit.
A transfer circuit for the operation test of an LSI system comprising:
- mode setting means for selectively setting a first or second operation mode;
- a plurality of shift register means connected to function blocks of said LSI system and each including a plurality of scan registers which are connected to input and output terminals of a corresponding one of the function blocks to respectively latch one of input and output data of the corresponding function block in the first operation mode and which are serially connected to shift the contents in the second operation mode;
- and
- serial transfer means for serially connecting said plurality of shift register means to constitute a shift register circuit.
Dependencies are inferred from the claim text.