Test apparatus for electronic equipment

Portable test apparatus for tracing faults in electronic equipment including or associated with a microprocessor,

• (a) a control means
• (b) a test configuring means selected from a plurality of test configuring means, each of said plurality of test configuring means containing read only memory means programmed to contain a range of diagnostic tests specific to a particular type of unit under test,
• (c) means for data transfer between the control means and the test configuring means, and
• (d) means for data transfer between the test configuring means and a unit under test,
• said control means comprising a microprocessor, data storage means, means for data transfer between said data storage means and said microprocessor of the control means, input command means, means for data transfer between said input command means and said microprocessor of the control means, output display means, and means for data transfer between said microprocessor of the control means and said output display means, said data storage means of the control means including read only memory means containing data to be accessed by said microprocessor of the control means for all test operations, and said input command means including a keyboard;
• and said test configuring means comprising data storage means and input/output means for controlling data transfer between the test configuring means and the microprocessor of the control means and for controlling data transfer between the test configuring means and the unit under test, said data storage means of the test configuring means including read only memory means containing data to be accessed by said microprocessor of the control means for diagnostic tests specific to a particular type of unit under test.