Method for locating weft thread defects in fabric
AssigneePicanol N.V.
InventorsPiet Verdiere, Michel Vandeweghe
Life of this patent
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Abstract
A process for locating weft thread defects in woven fabrics includes using a macro (close-up) lens and video camera to produce an enlarged image of the fabric, and then observing and evaluating the weft pattern from the video generated image. Transmissive and reflecting illumination may be used on the fabric to enhance the video image. Evaluation and measurement of weft thread positions is carried out by direct visual observation or by using computerized pattern recognition systems with micro processor techniques involving digitizing the video image. A relaxation defect of weft thread is determined by measuring variation between weft thread spacing when the fabric is viewed from two different viewing angles.
Claims4
A method for locating the depth of weft threads in a woven fabric including the steps of:
- (a) illuminating the fabric surface with contrast enhancing light;
- (b) generating a close-up first video image of the illuminated fabric surface located in a first plane relative to the video viewing angle, the image depicting the surface profile of the woven threads, in particular the weft thread;
- (c) from the video image, determining the distance V between adjacent weft threads;
- (d) rotating the plane of the fabric relative to the video viewing angle about an axis extending parallel to the weft threads and generating a close-up second video image of the illuminated fabric surface in a second plane;
- (e) from the second video image determining the distance W between the adjacent weft threads;
- (f) determining the weft thread depth D according to the formula
- W=V.multidot.cos B+D sin B.
Dependencies are inferred from the claim text.