Electronic Circuit board testing system and method

An electronic circuit board testing system comprising:

• means for applying a signal test pattern input to an electronic circuit board being tested;
• data capture means capturing an output signal sample from said circuit board;
• data storage means storing an electronic circuit schematic model of said circuit board under test;
• means for applying input signal test pattern received from said data capture means to corresponding points on said electronic circuit board schematic model retrieved from said data storage means;
• calculating means for generating calculated signal sample representing the functional schematic model outputs from said signal test pattern input;
• and
• comparing means comparing the functional schematic model calculated signal sample with the captured signal sample from said electronic circuit board being tested captured by said data capture means;
• whereby defect in said electronic cirucit board being tested are determined by discrepancies between the calculated signal samples form paid functional schematic model outputs and captured signal sample from said electronic circuit board outputs.