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US 4,791,356 AGranted
In-circuit testing system
AssigneeZehntel Incorporation
InventorsFrederick E. Warren, Harvey B. Crisler, Robert G. Jacobson, Chang H. Kim, Edward C. Llewellyn
Life of this patent
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Abstract
An in-circuit test system having means to stimulate the device-under-test at any desired electrical node of the device, means to record the device's response waveform at any node, means to edit the response waveform, and means to use the edited waveform to restimulate the same device in a subsequent in-circuit test.
Claims16
A test system for in-circuit testing of a device, the test system comprising:
- a. means for stimulating the device with a first waveform at any desired electrical node of the device;
- b. means for measuring and recording at any desired electrical node a second waveform generated by the device in response to the first waveform;
- c. means for editing the second waveform generated by the device to produce a third waveform;
- d. means for stimulating the device at any desired electrical node with the third waveform;
- and
- e. means for measuring and recording at any desired electrical node a fourth waveform generated by the device in response to the third waveform.
3 more elements
A method for in-circuit testing of a device, the method comprising the steps of:
- a. stimulating the device with a first waveformat any desired electrical node of the device;
- b. measuring and recording at any desired electrical node a second waveform generated by the device in response to the first waveform;
- c. editing the second waveform generated by the device to produce a third waveform;
- d. stimulating the device at any desired electrical node with the third waveform;
- and
- e. measuring and recording at any desired electrical node a fourth waveform generated by the device in response to the third waveform.
3 more elements
Dependencies are inferred from the claim text.