Method for the manufacture of silicon oxide layers doped with boron and phosphorus
AssigneeSiemens Aktiengesellschaft
InventorsFrank S. Becker, Dieter Pawlik
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Abstract
A method for the manufacture of silicon layers containing boron and phosphorus dopants wherein the silicon wafers are positioned in a reaction chamber into which there is introduced, from separate sources, (a) tetraethylorthosilicate as a source of silicon dioxide, (b) trimethylborate as a source of boron, and (c) a phosphorus source. The three reactants are decomposed in the reaction chamber to deposit silicon dioxide doped with boron and phosphorus onto the wafers, the decomposition being carried out at a temperature of at least 600.degree. C. and at a substantially subatmospheric pressure.
Claims8
A method for the manufacture of silicon oxide layers doped with boron and phosphorus which is stable in contact with water comprises:
- providing a reaction chamber,
- positioning silicon wafers in said reaction chamber,
- introducing into said reaction chamber form separate sources, the reactants;
- (a) tetraethylorthosilicate
- (b) trimethylborate and
- (c) a phosphorus source consisting of trimethylphosphate and passing said trimethylphosphate and said trimethylborate in one direction through said reaction chamber and passing said tetraethylorthosilicate through said reaction chamber in the opposite direction, and
- decomposing said reactants in said reaction chamber to deposit silicon dioxide doped with boron and phosphorus onto said wafers, the decomposition being carried out at a temperature of at least 600.degree. C. and at a substantially sub-atmospheric pressure, the resulting deposite containing at least 5% by weight boron.
Dependencies are inferred from the claim text.