Optical sample illumination device for a spectroscopic ellipsometer having a high lateral resolution
AssigneeU.S. Philips Corporation
InventorsMarko Erman, Claude E. Hily, Jean Le Bris
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AssigneeU.S. Philips Corporation
InventorsMarko Erman, Claude E. Hily, Jean Le Bris
Estimating the term…
The invention relates to an optical sample illumination device for a spectroscopic ellipsometer of the rotating analyzer type. The image of the exit slit (F') of a monochromator is conjugated with a point (F'.sub.2) of a surface of a sample (E) by means of two spherical mirrors (M.sub.7 and M.sub.8). An astigmatism correction slit (F'.sub.15) is arranged in the proximity of the conjugate (F'.sub.1) of the exit slit(F') of the monochromator with respect to the spherical mirror (M.sub.7) and is arranged perpendicularly to this exit slit and to the optical path so that said correction slit is conjugated with the said point (F'.sub.2) through the spherical mirror (M.sub.8). A luminous spot without astigmatic errors is thus obtained.
An optical sample illumination device for a spectroscopic ellipsometer of the rotating analyzer type, comprising a monochromator having an exit slit whose image is conjugated with a surface of the sample by at least a first spherical mirror, and comprising a polarizer arranged between said spherical mirror and the sample, characterized in that for realizing the said conjugation the device also comprises a second spherical mirror as well as an astigmatism correction slit arranged in the proximity of the image of the exit slit of the monochromator formed by the first spherical mirror and arranged perpendicularly to the exit slit and to the optical path so that said correction slit is conjugated with the sample through the second spherical mirror resulting in a luminous spot corrected for astigmatic errors being obtained on the surface of the sample.
Dependencies are inferred from the claim text.