Control of signal timing apparatus in automatic test systems using minimal memory
AssigneeFairchild Camera and Instrument Corporation
InventorRichard F. Herlein
Life of this patent
Estimating the term…
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AssigneeFairchild Camera and Instrument Corporation
InventorRichard F. Herlein
Estimating the term…
A system which enables signals to be supplied at precisely desired times in an automatic test system. The apparatus includes a base delay memory which stores information related to a base time delay, while a vernier memory stores information relating to timing corrections to be made to the base time delay. The base delay memory controls a counter while the correction memory controls a vernier deskew apparatus for further delaying the output signal from the counter. To prevent carries from the vernier memory from influencing the base delay memory, the most significant bit of the vernier memory is of the same significance as the least significant bit of the base delay memory. The most significant bit of the vernier memory is also connected to drive the counter, in effect providing the counter with two least significant bits, and enabling a single base delay memory to control more than one signal timing paths.
Apparatus for supplying a signal after a predetermined time delay comprising:
Dependencies are inferred from the claim text.