Temperature-compensated interface circuit between "OR-tied" connection of a PLA device and a TTL output buffer
AssigneeAdvanced Micro Devices, Inc.
InventorNader Vasseghi
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AssigneeAdvanced Micro Devices, Inc.
InventorNader Vasseghi
Estimating the term…
An interface circuit (110) for interfacing between an "OR-tied" connection (P) of a programmable logic array device (10) and a TTL output buffer (36) includes a first bandgap generator (40), a high level clamp circuit (30), a second bandgap generator circuit (42), and a sensing circuit (26). The first bandgap generator (40) generates a first reference voltage (VB1) which has a positive temperature coefficient. The second bandgap generator (42) generates a second reference voltage (VB2) which has a negative temperature coefficient. A resultant base drive current (I.sub.x) is supplied to the base of a phase splitter transistor (Q2) in the output buffer (36). The resultant current (I.sub.x) is controlled by the first and second bandgap generators (40, 42), the current being higher at low temperatures and being smaller at high temperatures.
An interface circuit (110) for interfacing between an "OR-tied" connection (P) of a programmable logic array device (10) and a TTL output buffer (36) so as to provide a high speed of operation over a wide range of temperature variations, said interface circuit comprising:
A programmable logic array device having an "OR-tied" connection and used for driving an output buffer so as to provide a high speed of operation over a wide range of temperature variations, said device comprising:
Dependencies are inferred from the claim text.