Method of making vertical inverter
AssigneeTexas Instruments Incorporated
InventorPallab K. Chatterjee
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Abstract
One embodiment of the present invention includes a vertical inverter. A layer of P-type material is formed on the surface of an N+-type substrate, followed by formation of an N+ layer, a P+ layer, an N- layer and a P+ layer. (Of course different doping configurations may be used and remain within the scope of the invention.) A trench is then etched along one side of the stack thus formed and a connector is formed to the middle P+ and N+ layers. Another trench is then formed where a gate insulator and a- gate are formed. The gate serves as the gate for both the N-channel and P-channel transistors thus formed.
Claims3
A process for forming an integrated electronic device, comprising the steps of:
- forming a substrate of a first conductivity type;
- forming a first channel layer of a second conductivity type formed on the surface of said substrate;
- forming a first drain layer of said first conductivity type formed on the surface of said first channel layer;
- forming a second drain layer of said second conductivity type formed on the surface of said first drain layer;
- forming a second channel layer of said first conductivity type formed on the surface of said second drain layer;
- forming a source layer of said second conductivity type formed on the surface of said second channel layer;
- forming a conductive gate vertically disposed on an edge perpendicular to the plane of and adjacent to said first and second channel layers, said first and second drain layers and said source layer wherein said gate is insulated from said layers;
- and
- forming a conductive region connected to said first and second drain layer.
A process for forming an integrated electronic device, comprising the steps of:
- forming a substrate of crystalline silicon of a first conductivity type;
- epitaxially depositing a first channel layer of crystalline silicon and of a second conductivity type on the surface of said substrate;
- epitaxially depositing a first drain layer of crystalline silicon and of said first conductivity type on the surface of said substrate;
- epitaxially depositing a second drain layer of crystalline silicon and of said second conductivity type on the surface of said substrate;
- epitaxially depositing a second channel layer of crystalline silicon and of said first conductivity type on the surface of said substrate;
- epitaxially depositing a source layer of crystalline silicon and of said second conductivity type on the surface of said substrate;
- etching a first cavity through said first and second channel layers, said first and second drain layers and said source layer into said substrate;
- oxidizing the walls of said first cavity;
- depositing a conductive material into said first cavity;
- etching a second cavity through said first and second channel layers, said first and second drain layers and said source layer into said substrate;
- filling said second cavity with an insulating material to a level above above the top surface of said first channel layer and below said first drain layer;
- filling the remainder of said second cavity with a conductive material to a level above the top surface of said second drain layer and below said second channel layer;
- and
- filling the remainder of said second cavity with an insulating material.
Dependencies are inferred from the claim text.