Optical analytical instrument for testing the transmission and reflection of a sample

An optical system for an analytical instrument designed for testing the transmission and reflection of a sample, the optical system having a source of a collimated beam of radiation, a detector for detecting the radiation, and a support which supports the sample to be analyzed, comprising:

• (a) optical elements arranged to receive the incoming beam of radiation from the source, focus the radiation on the sample, collimate the radiation transmitted through the sample into a beam and direct the beam to the detector in a path which crosses the path of the incoming beam from the source;
• and
• (b) intercept means selectively interposable into the incoming beam from the source at the position at which it crosses the beam directed to the detector for, when interposed into the beam, directing a portion of the incoming beam backwardly along the path of radiation through the optical elements so that the beam portion is focused on the sample without moving the sample and the radiation reflected off of the sample is collimated in a beam directed to the detector back past the intercept means, wherein the intercept means is activated to test the reflection of the sample, so that the optical elements which collimate the radiation transmitted through the sample into the beam and direct the beam to the detector are used to test both the transmission and reflection of the sample.

An optical system for analytical instrument designed for testing the transmission and reflection of a sample, the optical system having a source of a collimated beam of radiation, a detector for detecting the radiation, and a support which supports the sample to be analyzed, comprising:

• (a) optical elements arranged to receive the incoming beam of radiation from the source, focus the radiation on the sample, collimate the radiation transmitted through the sample into a beam and direct the beam to the detector;
• and
• (b) intercept means selectively interposable into the incoming beam from the source for deflecting the radiation passing through the optical elements such that radiation reflected from the sample without moving the sample is directed backwardly through the optical elements and focused on the detector, wherein the intercept means is activated to test the reflection of the sample so that the optical elements which collimate the radiation transmitted through the sample into the beam and direct the beam to the detector are used to test both the transmission and reflection of the sample.

A method of analyzing a sample with analytical radiation in an optical system which has a source of a collimated beam of radiation, a detector for detecting the radiation, a support which supports the sample to be analyzed, optical elements arranged to receive the incoming beam of radiation from the source, focus the radiation on the sample, collimate the radiation transmitted through the sample into a beam and direct the beam to the detector, comprising the steps of:

• (a) selectively redirecting a portion of the beam from the source such that the redirected beam of analytical radiation is incident on the sample and such that the redirected beam and a beam of analytical radiation reflected from the sample follow parallel paths to and from the sample through the optical elements which focus the radiation on the sample;
• and
• (b) directing the radiation reflected from the sample back to the detector.