Direct-heated gas-flow measuring apparatus
AssigneeNippon Soken, Inc.
InventorsMinoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
Life of this patent
Estimating the term…
Loading patent…
AssigneeNippon Soken, Inc.
InventorsMinoru Ohta, Kazuhiko Miura, Seizi Huzino, Kenji Kanehara, Tadashi Hattori
Estimating the term…
A direct-heated gas-flow measuring apparatus including a measuring tube disposed in the gas stream, a film resistor for generating heat and detecting the temperature thereof, and a feedback control circuit for controlling the heat generated by the film resistor so that the temperature of the film resistor is a predetermined value. Provided at least at the upstream side of the film resistor near thereto is a shield for reducing the accumulation of deposits on the film resistor. The shield and the film resistor have substantially the same thickness to satisfy the condition: l/t.ltoreq.50 where l is a distance therebetween and t is a thickness thereof.
A direct-heated type gas-flow measuring apparatus comprising:
A direct-heated type gas-flow measuring apparatus comprising:
A direct-heated type gas-flow measuring apparatus comprising:
A direct-heated type gas-flow measuring apparatus comprising:
A direct-heated type gas-flow measuring apparatus comprising:
A direct-heated type gas-flow measuring apparatus comprising:
Dependencies are inferred from the claim text.