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US 4,785,200 AGranted
Self correcting single event upset (SEU) hardened CMOS register
AssigneeMotorola, Inc.
InventorRobert C. Huntington
Life of this patent
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AssigneeMotorola, Inc.
InventorRobert C. Huntington
Estimating the term…
A self correcting single event upset-hardened CMOS register comprises a master portion and a slave portion. The master portion is coupled to a source of data and includes a feedback means such that said master portion can store said data during the first phase of a bi-phase clock signal. A slave portion including a second feedback path, has an input coupled to the output of said master portion and has an output which comprises the output of the register. An odd plurality of inverters is placed in series in the feedback path so as to isolate each node which is a possible site for high-energy particle impingement from other nodes in the loop and to attenuate and delay any resulting impulses such that the state of the error pulse cannot be maintained thus permitting the slave loop to remain in the state determined by the preceding data pulse.
An improved register of the type wherein there is provided a master portion including a first feedback path, which master portion stores data during the first phase of a bi-phase clock signal, and a slave portion having an output and having an input coupled to said master portion including a second feedback path for storing said data during a second phase of said bi-phase clock signal, said slave portion including a series inverter and said second feedback path extending from the output of said series inverter to the input of series inverter, said master portion being isolated from said slave portion during said second phase, the improvement commprising:
A CMOS register, comprising:
Dependencies are inferred from the claim text.