Spectroscopic measurement system
AssigneeShimadzu Corporation
InventorTeiichi Shimomura
Life of this patent
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Abstract
A spectroscopic measurement system comprises at least two kinds of diffraction gratings whose grating surfaces are in line, an exchange device for exchanging the positions of the two kinds of diffraction gratings in connection with incident light to be measured while the two kinds of diffraction gratings are placed in a predetermined rotation angle, at least two kinds of detectors having characteristics corresponding to those of the two kinds of diffraction gratings respectively, a light path switch for switching a path of diffraction light toward either of the two kinds of detectors, and a switch circuit for switching the detection output of the two kinds of detectors in synchronization with the exchange operation of the two kinds of diffraction gratings.
Claims5
A spectroscopic measurement system comprising:
- light source means for generating incident light;
- at least two kinds of diffraction gratings with different efficiency characteristics whose grating surfaces are in line, and the diffraction efficiencies being good over different wavelength regions;
- exchange means for exchanging the positions of said diffraction gratings in connection with the incident light to be measured while said diffraction gratings are placed in a predetermined rotation angle;
- at least two kinds of detectors having different characteristics corresponding to those of said diffraction gratings, respectively;
- light path switch means for switching a path of diffraction light from said diffraction gratings at high speed in order to alternatively forward the diffraction light to either of said detectors;
- and
- switch means for switching the detection output of said detectors in synchronization with the exchange operation of said diffraction gratings.
Dependencies are inferred from the claim text.