Device for the testing and/or processing of small component parts

Device for supplying individual electrical component parts having end face contacts, preferably electronic micro-chips, to a measurement and/or processing station from a components container, into which the electrical components are introduced without being ordered, by means of a conveyor belt serving as a carrier for the electrical components, which belt moves below the components container that is provided with an exit opening at its bottom which, in comparison to the size of the components, is elongated in the movement direction of the conveyor belt and said belt includes individual accommodation areas characterized in that the accommodation areas of the conveyor belt are sized to the dimensions of the electrical components in such a manner that in the locale of the measurement and/or processing station, the end face contacts of the electrical components will be located in a defined position in relation to a contact element of the measurement station or a tool of the processing station and the measurement or processing station includes a swing arm extending across and above the belt which moves towards and away from the belt, said swing arm includes a pin-like positioning element depending vertically from the swing arm and having a conical or spherical point, whereby the diameter of the pin is slightly greater than the diameter of a positioning hole in the belt thereby providing an air cushioning effect when the pin approaches the belt and the tool or contact element is also attached to the swing arm in the region of said positioning element, and a spring element is provided which presses the swing arm against the electrical component.