Semiconductor arrangement

In a power semiconductor arrangement including at least one power semiconductor element with high current carrying capability composed of a semiconductor material which generates recombination radiation when current flows through the semiconductor element, a control element disposed for monitoring the operation of said semiconductor element, with said control element comprising a device having an internal photoelectric effect and disposed for receiving the recombination radiation generated in said semiconductor material for producing an output parameter representative of the intensity of such radiation, and monitoring means connected to said control element for regulating the current flowing through said semiconductor element as a function of the output parameter;

• the improvement wherein:
• said monitoring means is operative for monitoring the current through, and the temperature of, said semiconductor element;
• said control element is a semiconductor-based device having at least one pn-junction;
• and said monitoring means cooperate with said control element for monitoring the temperature of said semiconductor element, on the basis of the dark current behavior of said control element, during the reverse bias phases of said semiconductor element.

In a power semiconductor arrangement including at least one power semiconductor element with high current carrying capability composed of a semiconductor material which generates recombination radiation when current flows through the semiconductor element, a control element disposed for monitoring the operation of said semiconductor element, with said control element comprising a device having an internal photoelectric effect and disposed for receiving the recombination radiation generated in said semiconductor material for producing an output parameter representative of the intensity of such radiation, and monitoring means connected to said control element for regulating the current flowing through said semiconductor element as a function of the output parameter;

• the improvement wherein:
• said monitoring means is operative for monitoring the current through, and the temperature of, said semiconductor element;
• said control element is a semiconductor-based device without a pn-junction;
• and said monitoring means cooperate with said control element for monitoring the temperature of said semiconductor element, on the basis of the value of the dark resistance of said control element, during the reverse bias phases of said semiconductor element.