Semiconductor memory having redundancy
AssigneesHitachi, Ltd., Hitachi Device Eng. Co., Ltd.
InventorsHiroaki Nanbu, Kunihiko Yamaguchi, Noriyuki Honma, Kazuo Kanetani, Motoaki Matumoto, Kazuhiko Tani, Kenichi Ohata
Life of this patent
Estimating the term…
Abstract
Herein disclosed is a bipolar memory having redundancy, which can be produced with a small area. In this semiconductor memory having a body memory for storing data and a spare memory for relief of fault bit of the body memory, a row is selected by cutting fuses in a decoder. Fundamentally signal lines such as word lines are not provided with fuses. Other parts including a power source and a reference voltage source are provided with fuses without decreasing the operating speed accompanied by only a slight increase in the area.
Claims14
A bipolar memory having redundancy, comprising:
- a memory array including bipolar memory cells;
- a redundancy row including at least one row of memory cells;
- an address buffer made receptive of an address signal;
- decoder means made receptive of said address signal for selecting said memory array;
- and
- redundancy row selecting means including:
- first and second bipolar transistors having their bases made receptive of said address signal;
- third and fourth bipolar transistors having their emitter electrodes connected with the emitters of the first and second bipolar transistors and their bases made receptive of a reference voltage;
- and a current source having fuses connected with said emitter electrodes, respectively, so that a redundancy row selection signal may be outputted from the collectors of said first and third bipolar transistors or said second and fourth bipolar transistors,
- whereby said fuses are cut so that the selection signal may be outputted when said address signal indicates the address of a fault row.
A bipolar memory having redundancy, comprising:
- a memory array including bipolar memory cells;
- a redundancy row including at least one row of memory cells;
- an address buffer made receptive of an address signal;
- decoder means made receptive of said address signal for selecting said memory array;
- and
- redundancy row selecting means including:
- first and second bipolar transistors having at least their bases made receptive of said address signal corresponding to an address number;
- a third bipolar transistor having its emitter electrode connected with the emitters of the first and second bipolar transistors and its base made receptive of a reference voltage;
- and a current source connected with the emitters of said first, second and third bipolar transistors and the bases or emitters of said first and second or third bipolar transistor are provided with fuses so that the redundancy row selection signal may be outputted from the collectors of said first, second and third bipolar transistors,
- whereby said fuses are cut so that said selection signal may be outputted when said address signal indicates the address of a fault row.
A bipolar memory having redundancy, comprising:
- a memory array including bipolar memory cells;
- a redundancy row including at least one row of memory cells;
- an address buffer made receptive of an address signal;
- decoder means made receptive of said address signal for selecting said memory array;
- and
- redundancy row selecting means including:
- first and second bipolar transistors having their bases made receptive of said address signal;
- third and fourth bipolar transistors having their emitter electrodes connected with the emitters of the first and second bipolar transistors and their bases made receptive of a reference voltage;
- and a current source having fuses connected with said emitter electrodes, respectively, so that a redundancy row selection signal may be outputted from the collectors of said first and third bipolar transistors or said second and fourth bipolar transistors,
- wherein said fault row is isolated from said row selection means,
- wherein said fault row is equipped with voltage stabilization means, and
- wherein said fuses are made of poly-silicon,
- whereby said fuses are cut so that the selection signal may be outputted when said address signal indicates the address of a fault row.7
Dependencies are inferred from the claim text.