Semiconductor memory device with high voltage switch
AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsYasushi Terada, Takeshi Nakayama, Kazuo Kobayashi
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AssigneeMitsubishi Denki Kabushiki Kaisha
InventorsYasushi Terada, Takeshi Nakayama, Kazuo Kobayashi
Estimating the term…
A semiconductor memory device according to the present invention includes a first high-voltage switch (20) formed by a first transistor (21), a second transistor (22), a first capacitor (23) and a third transistor (24) and a second high-voltage switch (30) formed by a fourth transistor (31), a fifth transistor (32), a second capacitor (33) and a sixth transistor (34). In a write cycle, input data are stored in capacitors (25, 35). In an erase cycle, the second high-voltage switch (30) is driven by a clock signal (.phi..sub.2) to make the control gate line (4) rise at a high voltage. In a program cycle, the first high-voltage switch (20) is driven by a clock signal (.phi..sub.1) to make the bit line of the bit to be written with data "0" rise at a high voltge, and upon completion of the program cycle, charges stored in the capacitor (25) are discharged to reset a column latch. Thus, the device requires no inverter and may be provided with only one high voltage source.
A semiconductor memory device comprising bit lines, control gate lines, a high voltage source and first and second high-voltage switches,
Dependencies are inferred from the claim text.