Method and apparatus for measuring positions on the surface of a flat object
AssigneeNippon Kogaku K.K.
InventorsTaro Ototake, Tatsumi Ishizeki
Life of this patent
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AssigneeNippon Kogaku K.K.
InventorsTaro Ototake, Tatsumi Ishizeki
Estimating the term…
A method and apparatus for the precision measurement of positions, dimensions, etc., of a pattern or mark formed on the surface of a flat object such as a photographic mask or reticle. The amount of vertical deviation of the object with respect to a reference plane is detected at each of a plurality of measuring points and the incline of the surface of the object with respect to the reference plane at each of the measuring points is determined in accordance with the amounts of deviation and the distance between the measuring points. The coordinate positions of each of the measuring points in the reference plane are measured in accordance with the amount of movement of the object parallel to the reference plane and the coordinate positions are corrected in accordance with the corresponding incline.
A method of measuring positions of a plurality of measuring points on a surface of a flat object mounted, along a reference plane, on a stage movable parallel to said reference plane, said method comprising the steps of:
A method of measuring a distance between first and second measuring points on a surface of a flat object mounted, along a reference plane, on a stage movable parallel to said reference plane, said method comprising the steps of:
An apparatus for measuring a position of a measuring point on a surface of a flat object comprising:
Dependencies are inferred from the claim text.