On-chip programmability verification circuit for programmable read only memory having lateral fuses
AssigneeMotorola, Inc.
InventorGene T. Sluss
Life of this patent
Estimating the term…
Loading patent…
AssigneeMotorola, Inc.
InventorGene T. Sluss
Estimating the term…
A Programmable Read Only Memory (PROM) and an on-chip programmability verification circuit is provided that allows for the verification of the programmability of lateral fuses. The PROM comprises a plurality of word lines, a plurality of bit lines, and a plurality of fuses, wherein each of the fuses are uniquely coupled between one of the word lines and one of the bit lines. A sense amplifier is coupled between each of the word lines and an output terminal. One each of a plurality of variable voltage current sources having a test voltage applied thereto is coupled to one of the sense amplifiers for providing a current to the sense amplifier, and in turn to the word line and fuse, wherein the resistance of the fuse in relation to a nominal value may be determined by comparing the test voltage and an output voltage on the output terminal.
A programmable memory circuit comprising:
An improved programmable memory circuit including a plurality of lateral fuses, first means coupled to said plurality of lateral fuses for selecting one of said plurality of fuses, second means coupled to said plurality of lateral fuses for sensing a voltage across one of said plurality of fuses and providing an output, wherein the improvement comprises:
Dependencies are inferred from the claim text.