Apparatus and method for measuring electric field by electroreflectance

Abstract

Apparatus and method for measuring an electric field using the electroreflectance effect. The apparatus comprises sensor means and a probe positionable at the point at which the electric field is to be measured. The probe comprises a layer of en electroreflective material having first and second surfaces. An optical source signal is directed onto the probe such that reflection or transmission at the first and second surfaces produces an optical output signal. The intensity of the output signal provides a measure of the electroreflective effect and therefore a measure of the electric field. The wavelength of the source signal is selected such that the electroreflective material exhibits the electroreflective effect at that wavelength, and such that the reflectance of the layer of electroreflective material at that wavelength changes as the index of refraction of the electroreflective material changes.

Dependencies are inferred from the claim text.