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AssigneeHitachi, Ltd. Hitachi Instrument Eng.
InventorsKonosuke Oishi, Koichi Uchino, Hideo Yamada, Seigo Kamitake, Masao Hashimoto
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An absorption profile indicative of a relation in atomic absorption spectroscopy between the absorbance of a desired element and time has a constant half-width independent of the concentration of the desired element in a sample, and hence the half-width of absorption profile with respect to the desired element can be previously determined from data which is obtained by the measurement of a standard sample. In an atomic absorption spectrophotometer herein disclosed, the half-width of absorption profile is previously determined in the above-mentioned manner, and the true peak value of an absorption profile obtained by measuring a sample which contains the desired element at a high concentration, is calculated using the time width of this absorption profile at a predetermined absorbance and the previously-determined half-width.
An atomic absorption spectrophotometer including atomizer means for heating a sample which is to be analyzed, to atomic vapor, a light source for irradiating the atomic vapor with light, and a detector for detecting light having passed through the atomic vapor, for forming an absorption profile indicative of a relation between the absorbance due to atomic vapor of a desired element contained in the sample and time, on the basis of a signal from the detector, to determine the concentration of the desired element from the peak value of the absorption profile, said atomic absorption spectrophotometer comprising means for previously determining the half-width w of absorption profile from data which is obtained by measuring a standard sample, and for determining the true peak value h of the absorption profile of the desired element contained in the to-be-analyzed sample, on the basis of the time width v of said absorption profile at a predetermined absorbance k and the previously-determined half-width w.
Dependencies are inferred from the claim text.