Device for conveying components, particularly integrated chips, from an input magazine to an output magazine

Apparatus for testing and sorting electronic components, comprising an input magazine for the components, a testing device to which the components are supplied individually and consecutively from the input magazine, an output magazine with inclined separate receiving ducts, and a component conveyor device and a support rod arranged between the output magazine and the testing device, said component conveyor device being displaceable transversely to the receiving ducts along said support rod, said component conveyor device mounted to swivel about the support rod between a stop position and a release position for the components, said component conveyor device being provided with swivel means such that it is swivelled up from its stop position to its release position at a selected one of said receiving ducts to release a component carried thereby to such receiving duct.