Method for repair of opens in thin film lines on a substrate
AssigneeInternational Business Machines Corporation
InventorsAlbert Amendola, deceased, Ananda H. Kumar, Thomas R. Vance
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AssigneeInternational Business Machines Corporation
InventorsAlbert Amendola, deceased, Ananda H. Kumar, Thomas R. Vance
Estimating the term…
Disclosed is a method for repairing opens in thin film conductor lines on a substrate, preferably a multi-layered ceramic substrate. An unpatterned repair metal film is placed over a general area of open defects in conductive lines on a substrate. Preferably, this metal is placed over the conductive lines and opens therein by decal transfer. The assembly is then heated to cause diffusion bonding between the repair metal and conductive lines, but not between the repair metal and substrate. After diffusion bonding, the structure has metal bridges formed across any open defects covered by the repair film and also between adjacent conductive lines. The area of repair is then subjected to ultrasonic energy in a liquid ambient for a time at least long enough to remove metal bridges between adjacent conductive lines, but less than that required to remove repair metal bridges over the opens in the conductive lines. The resultant structure has metal bridges spanning opens in the conductive lines, and no metal bridges between adjacent conductive lines.
A method of repairing at least one open gap in conductive thin film circuit lines on a substrate comprising:
Dependencies are inferred from the claim text.