Method and apparatus for dynamically controlling the timing of signals in automatic test systems
AssigneeFairchild Semiconductor Corporation
InventorsRichard F. Herlein, Jeffrey A. Davis, E. James Cotriss
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AssigneeFairchild Semiconductor Corporation
InventorsRichard F. Herlein, Jeffrey A. Davis, E. James Cotriss
Estimating the term…
Apparatus for delaying an electrical signal includes a sequence of stages, each for delaying the signal. A coarser stage delays the signal by multiples of a predetermined fundamental delay interval and a finer stage provides for fine adjustment of the delay. The fine stage includes an integral number N of delay elements, the total providing a delay interval greater than the fundamental delay interval, whereby the fine delay intervals compensate for fabrication tolerances to enable accurate calibration of the combined system by post-fabrication measurement. In one implementation each delay stage includes a tapped transmission line to provide delay intervals, in another a ramp generator is used.
Apparatus connected between an input terminal and an output terminal for delaying an electrical signal supplied to the input terminal before supplying it to the output terminal, the apparatus comprising:
Apparatus for delaying an electrical signal comprising:
Apparatus for delaying an electrical signal comprising:
Apparatus connected between an input terminal and an output terminal for delaying an electrical signal supplied to the input terminal before supplying it to the output terminal, the apparatus comprising:
Dependencies are inferred from the claim text.