Built in self test input generator for programmable logic arrays
AssigneeMotorola, Inc.
InventorJohn E. Salick
Life of this patent
Estimating the term…
Abstract
A built in self test input generator (BISTIG) for programmable logic arrays (PLAs) providing exhaustive fault coverage, but requiring additional space of only 8 to 15% of the PLA area. The BISTIG contains a test vector generator and a product term control, each of which has a sequence generator and associated decoder. The sequence generators generate log.sub.2 (N) and log.sub.2 (M) test vectors for the test vector generator and the product term control respectively, where N is the number of inputs to the PLA and M is the number of product terms connecting the first level of the PLA with the second level of the PLA.
Claims6
A built in self test input generator (BISTIG) for a programmable logic array (PLA), wherein the PLA comprises a first level array adapted to receive N input signals in N input lines and to provide M product terms on M product term lines, and a second level array adapted to receive the M product terms on the M product term lines and to provide P output signals on P output lines, wherein N, M, and P are integers greater than one, the BISTIG comprising:
- a test vector generator comprising:
- a test signal input line originating from a test computer;
- a log.sub.2 (N) sequence generator for providing log.sub.2 (N) outputs along a plurality of lines to
- a one-of-N decoder which, in response to the outputs from the log.sub.2 (N) sequence generator, drives a set of N test input lines which the test vector generator couples to the N input lines of the PLA;
- wherein the test vector generator responds to a test signal on the test signal input line, by providing N test vectors on the N input lines of the first level array of the PLA;
- and
- a product term control comprising:
- a test signal input line originating from a test computer;
- a log.sub.2 (M) sequence generator for providing log.sub.2 (M) outputs along a plurality of lines to
- a one-of-M decoder which, in response to the outputs from the log.sub.2 (M) sequence generator, selectively enables the M product term lines of the second PLA individually;
- wherein the product term control responds to a test signal on the test signal input line.
A built in self test input generator (BISTIG) for a programmable logic array (PLA), wherein the PLA comprises a first level array adapted to receive 2N input signals on N input lines and to provide M product terms on M product term lines, and a second level array adapted to receive the M product terms on the M product term lines and to provide P output signals on P output lines, wherein N, M and P are integers greater than one, the BISTIG comprising:
- a test vector generator comprising:
- a test signal input line originating from a test computer;
- a log.sub.2 (N) linear feedback shift register for providing log.sub.2 (N) outputs along a plurality of lines to
- a one-of-N decoder which, in response to the outputs from the log.sub.2 (N) sequence generator, drives a set of N test input lines which the test vector generator couples to the N input lines of the PLA;
- and
- multiplexing means accepting input from the N test lines of the one-of-N decoder and providing output to the N input lines of the first level array of the PLA, wherein the multiplexing means is for selecting between the true or complement of the generated tests and for choosing between normal and test inputs;
- wherein the test vector generator responds to a test signal on the test signal input line, by providing N test vectors on the N input lines of the first level array of the PLA;
- and
- a product term control comprising:
- a test signal input line originating from a test computer;
- a log.sub.2 (M) linear feedback shift register for providing log.sub.2 (M) outputs along a plurality of lines to
- a one-of-M decoder which, in response to the outputs from the log.sub.2 (M) sequence generator, selectively enables the M product term lines of the second PLA individually;
- wherein the product term control responds to the test signal on the test signal input line.
Dependencies are inferred from the claim text.