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AssigneeSigma Corporation
InventorsEric Ireland, Rory M. O'Brien, Barrie Wall, Peter A. R. Hicks, Zbigniew Zaremba
Estimating the term…
A component inspection apparatus includes a component holder mounted on a compound slide structure. Two arrays of gauging elements are provided on a mutually perpendicularly movable slide. These arrays can be adjusted on the slide and each array includes a plurality of separate gauge elements movable by contact with the work and at least one linear transducer connected to each gauge element. In use, the slides are moved to a plurality of predetermined positions in a sequence. The displacements of the probe elements at each position are noted and compared with displacements obtained when the same sequence of positions is followed while a master componet is in the holder.
A gauging device for use in a component inspecting machine, comprising a carrier, a linear analog transducer having a body mounted on said carrier and a relatively moveable part mounted on said body, an elongated probe element supported on said carrier, a first coupling part on one end of the probe element, a second coupling part on the movable part of the transducer, one of said first and second coupling parts being a spherical element and the other being a socket for contacting the spherical element, said first and second coupling parts being interengaged such that longitudinal displacement of the probe element by contact of a contact tip at its other end is transmitted to the movable part of the transducer, said transducer providing, in use, an electrical output signal related to the position of the movable part thereof, relative to the transducer body.
A component inspection apparatus comprising:
Dependencies are inferred from the claim text.