Pattern tracer with dual scan slowdown circuit
AssigneeWestinghouse Canada Limited
InventorEnn Vali
Life of this patent
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Abstract
In a circular scanning pattern tracing system, a dual scanning pattern is provided to detect pattern changes in advance of the system steering axis. Pattern detection pulses from both the scanning patterns are adjustable in length and the overlap of the pulses is used to determine whether the system should slow down.
Claims4
In a circular scanning optical pattern tracer, means to generate a first signal indicative of intersection of the pattern and an optical scan of a first diameter, means to generate a second signal indicative of intersection of the pattern and an optical scan of a second diameter, means to produce from said first and second signals respective control signals of adjustable duration, means to detect coincidence of said control signals and produce in response thereto, a slowdown signal indicative of the deviation of the pattern from a straight line in advance of the center of rotation of said circular scan and means to utilize said slowdown signal to control the tangential velocity of said tracer.
Dependencies are inferred from the claim text.