Universal spectrometer system having modular sampling chamber
AssigneeLaser Precision Corporation
InventorWalter M. Doyle
Life of this patent
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Abstract
A spectrometer system is disclosed in which the sample-containing chamber is a separately constructed, enclosed modular unit which is readily attachable to, and detachable from, one wall of a housing which constitutes the basic unit of the spectrometer, and which contains an interferometer, one or more detectors, and other portions of the system. Various examples of the essentially unlimited types of sampling modules are disclosed. Also, automatic sample loading and unloading devices are disclosed, which are feasible because of the modular construction. And means of loading and unloading samples without purge loss are disclosed, which are feasible because of the modular construction.
Claims10
A spectrometer system comprising:
- an interferometer sub-assembly from which a first collimated beam is output;
- a detector sub-assembly toward which a second collimated beam is input;
- the first and second collimated beams being parallel to one another;
- means for enclosing the interferometer sub-assembly and the detector sub-assembly, said means providing first and second apertures for the first and second collimated beams, respectively;
- a unitary accessory enclosure adapted to be readily attached to, and readily detached from, the enclosing means, said enclosure having apertures aligned with said first and second apertures;
- a first mirror which is supported inside the accessory enclosure, and which is arranged to reflect the entire first aperture radiation beam at a ninety degree angle;
- a second mirror which is supported inside the accessory enclosure, and which is arranged to reflect the entire second aperture radiation beam at a ninety degree angle;
- and
- means for purging both the sub-assembly enclosing means and the accessory enclosure so as to replace the normal atmosphere with an optically non-interfering gas.
In a spectrometer system having an interferometer sub-assembly, a detector sub-assembly, and means for enclosing the interferometer sub-assembly and the detector sub-assembly, said enclosing means having first and second apertures:
- means for causing an interferometer-modulated collimated analytical beam from the interferometer sub-assembly to exit the enclosing means through the first aperture;
- means for passing to the detector sub-assembly a collimated radiation beam which enters the enclosing means through the second aperture;
- a readily-detachable sample-containing module attached to the enclosing means, and having two apertures aligned with the first and second apertures, respectively;
- means in the module for receiving the collimated radiation which exits from the first aperture, for illuminating the sample, and for directing post-sample collimated radiation through the second aperture;
- a hollow guiding member extending from the exterior of the sample-containing module into the interior thereof beyond the point where sample illumination occurs;
- and
- sample-carrying means insertable in the hollow guiding member in such a way as to block ingress of atmosphere to the interior of the module;
- each sample being removable from the interior of the module without permitting ingress of atmosphere to the interior of the module.
Dependencies are inferred from the claim text.