Back to results
US 4,646,005 AGranted
Signal probe
AssigneeMotorola, Inc.
InventorCarl R. Ryan
Life of this patent
Estimating the term…
Abstract
A signal probe that does not require a direct ground contact is disclosed. The probe consists of a resistive measuring tip, an amplifier and a probe body which acts as an antenna providing a ground reference for the probe. The frequency of the signal measured may be compensated for by adjusting the resistive tip in the probe which varies the shunt capacitance between the resistor and the probe body.
Claims9
A signal measuring probe comprising:
- measuring tip means for receiving a signal;
- an amplifier coupled to said tip means;
- a body housing said amplifier and said tip means, said body being an antenna providing a ground reference for said probe;
- and
- frequency compensation means for compensating said signal, said frequency compensation means being determined by said measuring tip means placement with respect to said body housing.
2 more elements
A method of measuring a signal utilizing an ungrounded probe with an adjustable frequency response comprising the steps of:
- adjusting the frequency response of said probe;
- providing a circuit to be tested, said circuit having a test point;
- contacting said test point with a tip of said probe;
- providing a high input impedance to said probe;
- reducing the loading effect on said circuit;
- providing low input capacitance to said probe;
- utilizing an antenna effect of said probe as a ground for said probe;
- and
- providing an input impedance of said probe greater than an antenna impedance of said probe.
6 more elements
A signal measuring probe comprising:
- resistive measuring tip means for receiving a signal, said resistive measuring tip means including a resistor, a first lead, and a second lead;
- an amplifier coupled to the second lead of said resistive measuring tip means;
- a body having said resistive measuring tip means and said amplifier affixed thereto, said body being an antenna providing a ground reference for said probe;
- a first shunt capacitance defined by said second lead of said resistor relative to said body;
- and
- a second shunt capacitance defined by the position of said resistor relative to said body.
3 more elements
Dependencies are inferred from the claim text.