Electron beam control assembly for a scanning electron beam computed tomography scanner
AssigneeImatron, Inc.
InventorRoy E. Rand
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AssigneeImatron, Inc.
InventorRoy E. Rand
Estimating the term…
An improved ion clearing electrode assembly for use in an electron beam production and control assembly which is especially suitable for use in a scanning electron beam computed tomography X-ray scanning system. The assembly uses a vacuum sealed housing chamber which is evacuated of internal gases and in which the electron beam is generated and propagated. Normally residual gas within the chamber interacts with the electrons of the beam to produce positive ions which have the affect of neutralizing the space charge of the electron beam and thereby causing focusing difficulties and destabilization of the beam. The ion collecting electrodes herein are an improvement of those disclosed in the co-pending Rand U.S. patent application Ser. No. 434,252, now U.S. Pat. No. 4,521,900. The electrodes are designed to extract the ions and reduce their neutralizing effect while maintaining a precisely uniform electric field and therefore beam optical aberrations are minimized. In addition, the electrode provides flexibility in the variation of parameters which effect ion extraction and the neutralization fraction.
An electrode for removing ions from an electron beam having a beam envelope, and propagating along an axis, the electrode being of substantially cylindrical configuration and extending substantially co-axially with the electron beam and comprising:
An electrode for removing ions from an electron beam having a beam envelope and propagating along an axis, the electrode being of substantially cylindrical configuration and extending substantially co-axially with the electron beam and comprising:
An improved ion clearing electrode for extracting ions from an electron beam propagated within a vacuum chamber and for providing a uniform electric field across the cross-section of the beam, comprising:
An improved ion clearing electrode for extracting ions from an electron beam propagated within a vacuum chamber and maintaining electric field uniformity across the beam, comprising:
An improved ion clearing electrode assembly for extracting ions from an electron beam propagated within a vacuum chamber and for maintaining electric field uniformity across the beam, the electrode assembly comprising first and second cylinder assemblies substantially co-axial with the electron beam, each said cylinder assembly comprising at least four corresponding sections extending substantially the length of each said assembly;
Dependencies are inferred from the claim text.