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US 4,619,528 AGranted
Phase resolved modulation Raman spectrometer
AssigneeExxon Research & Engineering Co.
InventorsAzriel Z. Genack, Bruce N. Perry
Life of this patent
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Abstract
A system for measuring fluorescence-suppressed Raman Scattering using intensity-modulated laser excitation, electro-optic demodulation of the emitted and scattered light, and a means to adjust the phase of optical transmission of the demodulator relative to the laser modulation.
Claims7
A system for measuring fluorescencesuppressed Raman scattering from a sample comprising:
- (a) a continuous wave laser beam means, whose intensity is modulated by a first modulator said modulated beam striking said sample so as to produce fluorescent and Raman radiation, wherein said fluorescent radiation is out of phase with Raman radiation by the angle .phi.;
- (b) an optical modulator means positioned so that said fluorescent and Raman radiation passes through a second modulator;
- (c) a phase shifter means for adjusting the phase of said second modulator by .phi..+-..phi..sub.o relative to said modulated laser beam where .phi..sub.o is an arbitrary phase;
- (d) spectrometer means for dispersing said radiation passing through said second modulator into spectra as a function of wavelength;
- (e) means for detecting said dispersed radiation, said spectra obtained at .phi.-.phi..sub.o then being subtracted from said spectra obtained at .phi.+.phi..sub.o.
2 more elements
Dependencies are inferred from the claim text.