Tunnel cathode mask for electron lithography and method for manufacturing and operating it
AssigneeSiemens Aktiengesellschaft
InventorBurkhard Lischke
Life of this patent
Estimating the term…
Abstract
A mask for corpuscular lithography permits a short exposure time for generating structures on semiconductor wafers, and provides a cost reduction of such structure generation. The mask has a tunnel cathode in corpuscle-emitting regions.
Claims12
In a mask for electron projection corpuscular lithography, the improvement comprising providing the mask as a tunnel cathode having a sandwich structure with an insulating region through which electrons tunnel in corpuscle-emitting regions and non-corpuscle emitting regions of the mask, and an absorber means being provided at the non-corpuscle emitting regions for absorbing electrons.
A method for adjusting a position of a mask for electron projection corpuscular lithography having a tunnel cathode in corpuscle-emitting regions of the mask, comprising the steps of:
- providing the mask as a tunnel cathode with a sandwich construction of a first metal, an absorber region, and a second metal;
- providing adjusting marks formed of first and second adjustment mark metals spaced by an insulator as a part of the mask which are electrically insulated from the first and second metals and which each also form tunnel cathodes;
- and
- adjusting the mask by energizing the adjusting mark tunnel cathodes while the tunnel cathode for the actual lithography is not energized and using electrons emitted from the adjustment marks to adjust the position of the mask, whereby thereafter the tunnel cathode for the actual lithography may be energized.
In a mask for electron projection corpuscular lithography, the improvement comprising a tunnel cathode in corpuscle-emitting regions of the mask, and wherein a structure comprising metal-insulator-superconductor is provided at said corpuscle-emitting regions.
A method for manufacturing a mask for electron projection corpuscular lithography, comprising the steps of:
- forming a tunnel cathode by providing a first metal layer, an insulating layer on a surface of the first metal layer, absorber regions at portions of the mask at which electron emission is not to occur, and a second metal layer overlying the insulating layer and the absorber regions, said second metal layer being sufficiently thin and the insulator being sufficiently thin so as to permit tunnel cathode electron emission from the first metal through the insulator and through the second metal onto a surface to be lithographed, the absorber regions being sufficiently thick to absorb emitted electrons;
- and
- forming said absorber region prior to application of the second metal layer by radiating regions at which it is desired to form the absorber regions so that absorber regions are grown thereat due to contamination with carbon in a vacuum in which the absorber regions are being grown.
A method for manufacturing a mask for electron projection corpuscular lithography, comprising the steps of:
- forming a tunnel cathode by providing a first metal layer, an insulating layer on a surface of the first metal layer, absorber regions at portions of the mask at which electron emission is not to occur, and a second metal layer overlying the insulating layer and between the absorber regions and the first metal layer, said second metal layer being sufficiently thin and the insulator being sufficiently thin so as to permit tunnel cathode electron emission from the first metal through the insulator and through the second metal onto a surface to be lithographed, the absorber regions being sufficiently thick to absorb emitted electrons;
- and
- forming said absorber regions after application of the second metal layer by radiating regions at which it is desired to form the absorber regions so that absorber regions are grown thereat due to contamination with carbon in a vacuum in which the absorber regions are being grown.
A mask for electron projection corpuscular lithography, comprising:
- a first metal layer;
- an insulating layer on a surface of the first metal layer;
- a second relatively thinner metal layer on the insulating layer except for portions of the mask at which electron emission is not to occur from the mask, said locations having absorbing regions;
- the insulating layer and the second metal layer being sufficiently thin so as to provide a tunnel cathode effect such that when a potential is applied between the first and second metal layers, electrons will pass through the insulating layer and the second layer so as to be available for lithographing a desired surface;
- and
- the absorber region being sufficiently thick so as to absorb electrons passing through the insulating layer from the first metal layer.
A mask for electron projection corpuscular lithography, comprising:
- a first metal layer;
- an insulating layer on a surface of the first metal layer;
- a second relatively thinner metal layer on the insulating layer;
- portions of the mask at which electron emission is not to occur having absorbing regions on a surface of the second metal layer opposite portions of the insulating layer;
- and
- the insulating layer and the second metal layer being sufficiently thin so as to provide a tunnel cathode effect wuch that when a potential is applied between the first and second metal layers, electrons will pass through the insulating layer and the second metal layer so as to be available for lithographing a desired surface;
- and
- the absorber regions being sufficiently thick so as to absorb electrons passing through the insulating layer and second metal layer from the first metal layer.
A method for electron projection corpuscular lithography, comprising the steps of:
- providing first and second metal layers with an insulator therebetween and wherein the insulator and the second metal layer are sufficiently thin so as to permit a tunnel cathode electron emission at desired regions for lithographing a surface, and wherein at other regions from which electron emission is not to occur, providing an absorber region of thickness sufficient to prevent tunnel cathode emission when a voltge is applied across metal layers M1 and M2 sufficient to cause tunnel cathode emission at the desired regions.
Dependencies are inferred from the claim text.