Spectroanalysis system
AssigneeAllied Corporation
InventorStanley B. Smith, Jr.
Life of this patent
Estimating the term…
Abstract
A chopperless spectroanalytical system of the double beam type in which radiation from a common source is split into reference and analysis beams. The two beams are directed along similar paths such that the analysis beam passes through an analysis region and the reference beam bypasses that analysis region. A monochromator has two spaced aperture regions such that one aperture region provides an entrance aperture for the analysis beam and an exit aperture for a dispersed portion of the reference beam; and the other aperture region provides an entrance aperture for the reference beam and an exit aperture for a dispersed portion of the analysis beam. The beams exiting from the two exit apertures are simultaneously monitored and compared to compensate for errors due to source fluctuations and the like.
Claims18
A spectroanalytical system with compensation for source intensity fluctuations or the like comprising
- means defining an analysis region,
- a radiation source,
- means for passing a first portion of radiation from said radiation source along a first (analysis) beam path through said analysis region for modification by sample material in said analysis region and for passing a second portion of radiation from said beam along a similar second (reference) beam path outside said analysis region,
- a monochromator with two spaced aperture regions, said aperture regions being disposed in a plane that is perpendicular to the axis of said monochromator and arranged such that an entrance aperture for the analysis beam and an exit aperture for a dispersed portion of the reference beam is provided in one aperture region and an entrance aperture for the reference beam and an exit aperture for a dispersed portion of the analysis beam is provided in the other aperture region, the apertures in each said aperture regions being defined by an elongated slit, and said monochromator being arranged such that radiation in each beam enters the monochromator adjacent one end of each slit and dispersed radiation from that beam exits the monochromator adjacent the opposite end of the other slit, said analysis beam and said dispersed portion of said analysis beam defining a first plane that passes through the axis of said monochromator and said reference beam and said dispersed portion of said reference beam defining a second plane that passes through the axis of said monochromator, said first plane being disposed at an angle to said second plane, and
- detector means for sensing radiation that emerges from said exit apertures for providing an indication of the effect of a sample in said analysis region on the radiation from said radiation source.
A spectroanalytical system comprising
- means defining an analysis region,
- a radiation source,
- means for passing a first portion of radiation from said radiation source along a first (analysis) beam path through said analysis region for modification by sample material in said analysis region and for passing a second portion of radiation from said beam along a similar second (reference) beam path outside said analysis region,
- a monochromator system that has a collimating element and a dispersing element, first and second slits symmetrically located with respect to the axis of the monochromator system,
- said monochromator being arranged such that one slit functions as an entrance aperture for the analysis beam and an exit aperture for a dispersed portion of the reference beam and the other slit functions as an entrance aperture for the reference beam and an exit aperture for a dispersed portion of the analysis beam,
- said analysis beam and said dispersed portion of said analysis beam defining a first plane that passes through the axis of said monochromator and said reference beam and said dispersed portion of said reference beam defining a second plane that passes through the axis of said monochromator, said first plane being disposed at an angle to said secnd plane, and
- detector means for simultaneously sensing radiation that emerges from each of the slits for providing an indication of the effect of a sample in said analysis region on the radiation from said radiation source.
Dependencies are inferred from the claim text.