Back to results
US 4,545,036 AGranted
Sense amplifier with time dependent sensitivity
AssigneeMostek Corporation
InventorDennis L. Segers
Life of this patent
Estimating the term…
Abstract
A dynamic RAM integrated circuit has improved resistance to soft errors caused by alpha particles by changing the trip-point voltage of the sense amplifier from a first value that provides resistance to bit line errors to a second, lower value that provides resistance to cell errors.
Claims4
An integrated circuit memory comprising:
- a plurality of memory cells;
- and
- a sense amplifier having first and second inputs, at least one of which is connectable through a bit line to at least one of said plurality of memory cells, for producing an output dependent on an input voltage difference between a cell voltage on that one of said first and second inputs connected to a selected memory cell and a reference trip-point voltage on the other of said first and second inputs;
- characterized in that:
- said reference trip-point voltage is controlled by time-dependent voltage control means to change over a predetermined time period from a first reference trip-point voltage after equilibration of said first and second inputs to a second reference trip-point voltage.
2 more elements
Dependencies are inferred from the claim text.