Stimulus/measuring unit for DC characteristics measuring
AssigneeHewlett-Packard Company
InventorsKoichi Maeda, Haruo Ito
Life of this patent
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Abstract
A novel digitized measuring system is disclosed for the measurement of the DC parameters of a wide variety of electrical and electronic devices. A stimulus measuring unit (SMU) is disclosed which can alternatively act as a voltage source and current monitor or as a current source and voltage monitor. A device under test (DUT) can be characterized without changing external connections and the resulting data can be manipulated and displayed in a wide variety of graphical or tabular forms.
Claims4
A stimulus/measuring unit for measuring the electrical characteristics of an electrical element, said stimulus/measuring unit comprising:
- a voltage source;
- a current measuring device connected in series with the voltage source;
- a current source;
- a voltage measuring device connected in parallel with the current source;
- and
- switch means coupled directly to both the series combination of the voltage source and the current measuring device, and the parallel combination of the current source and the voltage measuring device for selecting which of the series combination of the voltage source and current measuring device or the parallel combination of the current source and the voltage measuring device is coupled to the electrical element to be measured, so that said stimulus/measuring unit can both electrically stimulate the electrical element and measure the electrical response of the electrical element.
Dependencies are inferred from the claim text.