Electronic burn-in system
AssigneeArtronics Corporation
InventorsAnthony Santomango, Nicholas N. Hatheway, Jr.
Life of this patent
Estimating the term…
Abstract
A system for performing electronic burn-in testing of a component comprising a rack (20) which is electrically connectable to a power source. A tray (50) is on the rack and a mother board (MB) associated with the tray is electrically connectable to the rack. A daughter board (DB) is electrically connectable to the mother board and to a component to be tested. The daughter board is electrically dedicated to the component but neither the tray nor the mother board are dedicated to the component.
Claims4
A system for performing electronic burn-in testing of module from a source of test voltages comprising:
- a rack in the form of a skeletal frame structure, a removable tray slidable into the rack, a removable daughter board receivable in the tray,
- the rack having support means for receiving and releaseably supporting at least one removable tray, at least one power interface assembly on the rack for connecting the rack to the source of test voltages, a plurality of releasable electric connectors on the interface assembly for making electrical connection to th eremovable tray,
- the tray including a mother board circuit having a plurality of conductive paths, each path being connected to an electric contact that is engageable with one of the releasable connectors on the interface assembly when the tray is slid into the rack,
- means on the tray to receive and releasably support the daughter board, a plurality of releasable electric connectors on the mother board each connected to a conductive path, a plurality of electric contacts on the daughter board each of which is engageable with a releaseable connector on the mother baord when the daughter board is inserted into the tray,
- a module on the daughter board hardwired to at least one contact on the daughter board to recieve a test voltage from the mother board the daughter board containing signal means to indicate the presence of test voltage across the module.
Dependencies are inferred from the claim text.