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US 4,542,297 AGranted
Apparatus for measuring profile thickness of strip material
AssigneeBritish Steel Corporation
InventorAnthony C. Hold
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AssigneeBritish Steel Corporation
InventorAnthony C. Hold
Estimating the term…
This invention provides apparatus for measuring the thickness profile of steel strip comprising a radiation source reciprocally movable in a stepwise fashion across the strip width on one side thereof and a single elongated detector on the other side of the strip aligned with the scanning source. This detector may be a fluorescent scintillator which is responsive to the incident radiation, the amount of which is in turn dependent on the degree of absorption by the strip. Means are provided for sensing the degree of excitation in the detector in synchronism with the scanning source whereby to provide an output representative of the thickness profile of the strip. The profile may conveniently be displayed in analogue fashion on a television screen. A conventional thickness gauge, e.g. of the X-ray type, may conveniently be used in conjunction with the profile gauge to compensate the output of the latter for any variations in the strip thickness along the length of the coil.
Apparatus for measuring the thickness profile of strip, comprising a radiation source reciprocally movable across the strip width on one side thereof and a single elongated detector on the other side, aligned with the scanning source, responsive to incident radiation the amount of which is dependent on the degree of absorption by the strip, said detector being in the form of a rod like scintillator device having a myriad of scintillation particles embedded in a matrix;
Apparatus for measuring the thickness profile of movable strip, comprising a unit defining a C-shaped frame having upper and lower arms positioned across the strip width, a radio-isotope source mounted in the lower arm and reciprocally movable across the strip width and a rod-like fluroescent plastics scintillator mounted in the upper arm in alignment with the path of travel of said source, the light output from the scintillator being dependent on the degree of absorption by the strip, and photo-multiplier means for measuring the aggregate light output from along the length of the scintillator in synchronism with the movement of said source whereby to provide a representation of said thickness profile.
Dependencies are inferred from the claim text.