Test-signal generating device for testing electronic equipment
AssigneeThomson-CSF
InventorLuc Pham Van Cang
Life of this patent
Estimating the term…
Abstract
A generating device comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples to analog signals at the output of the device. A read/write memory is interposed between the digital-to-analog converter and the storage means. A computer is coupled to the storage means and to the read/write memory. The computer comprises means for generating test signals in the form of digital samples, means whereby the samples stored within the storage means and the test signals produced by the generating means are transferred into the read/write memory as well as means for synchronizing the transfer of samples stored within the read/write memory to the digital-to-analog converter.
Claims10
A test-signal generating device for testing electronic equipment and comprising means for storing test signals in the form of digital samples coupled to a digital-to-analog converter for converting the samples stored in digital form to analog signals at the output of the device, wherein said device comprises:
- a read/write memory interposed between the analog-to-digital converter and the storage means;
- a computer coupled to the storage means and to the read/write memory and comprising:
- means for generating test signals in the form of digital samples;
- means for transferring into the read/write memory the signals stored within the storage means and the test signals produced by the generating means;
- as well as means for synchronizing the transfer of samples stored within the read/write memory to the digital-to-analog converter.
Dependencies are inferred from the claim text.