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US 4,537,508 AGranted
Interferometer spectrometer having improved scanning reference point
AssigneeLaser Precision Corporation
InventorWalter M. Doyle
Life of this patent
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AssigneeLaser Precision Corporation
InventorWalter M. Doyle
Estimating the term…
An interferometer, for use in spectrometry, is disclosed in which a more reliable synchronization of the starting points of successive analytical scans is obtained by combining: (a) a moving retro-reflector in the variable-length arm which reflects both the analytical beam and the reference beam; (b) stationary reflecting means in the variable-length arm providing a flat "folding" reflector which causes the path of at least the reference beam from the retro-reflector to be folded on itself and returned to the retro-reflector; and (c) stationary reflecting means for the reference beam in the fixed-length arm so located as to offset the reference interferogram with respect to the analytical interferogram. Two versions of the invention are shown, each having two disclosed embodiments. In one version all three of the beams (clock, reference, and analytical) are "folded" by means of mirrors located adjacent to the moving retro-reflector. In the other version only the reference beam is folded.
In a spectrometer having means for receiving and integrating successive analytical interferograms provided by an analytical beam, which analytical interferograms are synchronized by reference interferograms provided by a reference beam, an interferometer, of the type having a fixed-length arm and a variable-length arm which is varied to cause spectral scanning, comprising:
In a spectrometer having electronic means for receiving and integrating successive analytical interferograms provided by an analytical beam, an interferometer, of the type having a fixed-length arm and a variable-length arm which is varied to cause spectral scanning, comprising:
Dependencies are inferred from the claim text.