Methods of and devices for determining the soldering capability of a solder wave
AssigneeAT&T Technologies, Inc.
InventorErnst A. Gutbier
Life of this patent
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AssigneeAT&T Technologies, Inc.
InventorErnst A. Gutbier
Estimating the term…
First and second transparent metallized gauge plates (52 and 52') of solder-nonwettable, heat-resistant material, such as glass or quartz, each have a solder wave test pattern in the form of spaced parallel metal strips (56 and 56') formed thereon. The metal strips (56) on the first gauge plate (52) are of progressively increasing widths, with a narrowest strip located adjacent one edge of the plate and a widest strip located adjacent an opposite edge of the plate. The metal strips 56' on the second gauge plate (52') are of uniform widths. The first gauge plate (52) is engaged with a solder wave (34) to measure the activation level of a soldering flux (44) being introduced into the solder wave, and thereby to determine the capability of the solder wave to produce properly soldered printed circuit board assemblies (10). The second gauge plate is engaged with the solder wave (34) to measure and/or adjust other flow characteristics of the solder wave, such as a width of solder wave impingement (80 ) on the printed circuit board assemblies (10).
A method of determining the capability of a solder wave to produce properly soldered parts when the parts are passed over the solder wave in a soldering operation, which comprises the steps of:
The method as recited in 5, in which:
A solder wave measuring device, which comprises:
Dependencies are inferred from the claim text.