Mass spectrometer
AssigneeESCO Corporation
InventorHisashi Matsuda
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AssigneeESCO Corporation
InventorHisashi Matsuda
Estimating the term…
In a mass spectrometer of the magnetic field type for analyzing the mass of ions by causing an ion beam to pass through a narrow slit and then through a deflecting magnetic field to be detected by an ion detector where the intensity of the deflecting magnetic field is varied, plural electrostatic quadrupole lenses are provided between the source slit and the deflecting magnetic field so as to give a converging property to an ion beam passing in a direction vertical to the median plane thereof and to give a diverging property to an ion beam passing in the direction of the radius thereof. This minimizes the gap spacing between the magnetic pole pieces which form the deflecting magnetic field, thereby improving sensitivity and detection as well as accuracy and measurement. Since the magnetic field can be intensified by making the gap spacing between the magnetic pole pieces narrower, the present device is applicable to a wider scope of uses, such as to the analysis of ions of greater mass or ions of higher molecules.
A mass spectrometer of the type comprising an ion source for emitting accelerated ions, means forming a slit through which ions are emitted from said source, a deflecting magnetic field for deflecting said ions after said ions pass through said slit, and an ion detector to detect ions exiting from said magnetic field, the intensity of the deflecting magnetic field being variable, the improvement wherein:
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