Method and equipment for mapping radiation deflection
AssigneeThe State of Israel, Atomic Energy Commission
InventorsOded Kafri, Aminadav Livnat
Life of this patent
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Abstract
Equipment and method for mapping an object using moire deflectometry wherein collimated radiation deflected from the object is used to generate a moire pattern and wherein by measuring linear deflections in the pattern, variations in characteristics of the object is determined.
Claims11
A method of determining properties of an object on the basis of the degrees of deflections of rays by the object for providing quantitative measurements, the steps comprising:
- providing from a source a beam of collimated rays;
- providing first and second gratings, oriented at a preselected angular orientation with respect to one another, to produce moire patterns as a result of the rays directed thereto;
- and
- placing the object in the path of the rays prior to reaching said gratings, whereby at least some of the rays are deflected by said object and effect the moire patterns in a measurable way, so that the degrees of deflections of the rays by the object are determinable therefrom to provide quantitative measurements.
An apparatus for mapping beam deflection caused by an object, comprising:
- source means for producing a beam of collimated rays of light;
- moire pattern producing means including first and second gratings spaced apart a measured distance, definable as .DELTA., and angularly oriented with respect to one another at a selected angle, definable as .theta., the space between said gratings providing an unobstructed path to enable rays passing said first grating to directly reach said second grating, to produce preselected moire patterns, said object being located in the path of said collimated rays between said source and said first grating, whereby said moire patterns are visually modifiable as a function of angular deflections of rays by said object;
- and
- means for measuring the deflection shown in the moire pattern as selected points to enable quantitatively determining characteristics of said object as a function of the deflections of rays by said object.
An apparatus for mapping beam deflection caused by an object characterized by having an outer reflective surface, comprising:
- source means for producing a beam of collimated rays of light;
- moire pattern producing means including first and second gratings spaced apart a measured distance, definable as .DELTA., and angularly oriented with respect to one another at a selected angle, definable as .theta., the space between said gratings providing an unobstructed path to enable rays passing said first grating to directly reach said second grating, to produce preselected moire patterns, said object being located in the path of said collimated rays between said source and said first grating, whereby said moire patterns are visually modifiable as a function of angular deflections of rays by said object;
- means for supporting said object on a plane which forms equal angles with the directions of the rays from said source to said plane and the non-deflected rays to said first grating, with points on said reflective surface deflecting reflected rays to said first grating at angles which relate to angles between said planes and tangential lines drawn through said points;
- and
- means for measuring the deflection shown in the moire pattern as selected points to enable quantitatively determining characteristics of said object as a function of the deflections of rays by said object.
Dependencies are inferred from the claim text.