X-Ray diffraction apparatus
AssigneeHitachi, Ltd.
InventorsMakoto Hayashi, Shinji Sakata, Tasuku Shimizu
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Abstract
The X-ray diffraction apparatus of the invention includes means capable of detecting the position and intensity distribution of the diffracted X-ray with respect to a thin bundle X-ray and means for moving the former means to a position at which the former means is capable of detecting the diffracted X-ray, and makes it possible to reliably and easily carry out rough detection of the position of the diffracted X-ray and fine detection of the intensity distribution of the diffracted X-ray without increasing the size of the diffracted X-ray detecting means.
Claims7
An X-ray diffraction apparatus comprising:
- means for radiating a micro-beam of X-rays to a material;
- means capable of detecting the position and intensity distribution of diffracted X-ray from said material;
- means for obtaining the total misorientation or the diameter of a crystal subgrain on the basis of a signal of said diffracted X-ray detecting means;
- and means for obtaining the creep life consumption factor of said material from the relationship between the total strain and the loading time under the creep state that is in advance obtained for the same material.
An X-ray diffraction apparatus for irradiating a material with X-rays and detecting the X-rays diffracted therefrom, comprising means for radiating a bundle of X-rays to said material, said means for radiating including changing means for selectively providing said bundle in the form of either a micro-beam or a conventional beam of X-rays, means for detecting diffracted X-rays, said detecting means comprising a first sensor for detecting the position of the diffracted X-rays and a second sensor for detecting the intensity distribution of diffracted X-rays, means for rotating said detecting means about the axis of the X-ray beam applied to said material, means for moving said detecting means in a radial direction with respect to the axis of said X-ray beam, and means for rotating said detectng means about its own axis.
Dependencies are inferred from the claim text.